X-Ray Diffraction and X-Ray Fluorescence Labs
The X-ray labs have two advanced instruments: the X-ray diffraction (XRD) instrument and the X-Ray fluorescence (XRF) instrument. The labs serves in teaching activities and in providing analyses to research projects at the Department of Geosciences. The labs also offer services to other research departments and institutes, as well as clients from industry.
Two robust instruments are available for analysis at the X-Ray Diffraction and X-Ray Fluorescence labs, the Bruker D8 Advance (XRD) and the Panalytical Axios Max (XRF). Photo: Gunn Kristin Tjoflot, UiO
Booking and prices
Prices: Contact Facility Manager
Booking: Contact Facility Manager
- XRD (X-Ray Diffraction): Bruker D8 Advance diffractometer with DaVinci design with Lynxeye detector and 90-position sample changer for high sample throughput (2kW Cu tube). Installed in 2011.
XRF (X-Ray Fluorescence): Malvern-Panalytical Axios Max Minerals Wavelength Dispersive Sequential Spectrometer (WDXRF) equipped with a 4kW Rh-tube and auto sample changer for continuous measurement. Installed in 2013.
Description of services:
- The X-Ray Diffraction lab:
- Bulk – qualitative and quantitative analysis of randomly oriented powder aggregates
- Clay – qualitative and quantitative analysis of oriented clay fractions
- The X-Ray Fluorescence lab:
- Major Elements – quantification from fusion bead analysis (SuperQ – Omnian, WROXI)
- Trace Elements – quantification from pressed pellet analysis (SuperQ - ProTrace)
- Thin Film Analysis (Stratos)
About the X-ray lab
The X-ray diffraction instrument at the Department of Geoscience is dedicated to qualitative mineral phase identification and semi-quantitative mineral composition analysis of rocks and sediments using standard PXRD (powder X-ray diffraction) techniques. While the primary focus is on academic research, routine industry assignments are also accepted (capacity permitting).
The X-ray fluorescence instrument is used by both the Department of Geoscience and the Department of Chemistry. The instrument is routinely used to measure major and trace element compositions of geological samples, as well as thin films for materials research.
As an employee or a student at UiO, you will first require training before you can use these facilities. Please contact the facility manager for more information.