I am an electron microscopist and a part of the Centre for Materials Science and Nanotechnology, based in the Oslo Science Park. I deal with electron imaging/ spectroscopy, aberration correction, precession, 4DSTEM, in-situ, fabrication, FIB, electrical measurements, multislice-method simulations and data analyses.
I use these techniques to get insights on materials related to sustainable energy, semiconductors, batteries, catalyst, etc. to unravel the structure and optoelectronic properties at the atomic level. My role is to kick-start new collaborations by uncovering and designing new experiments.
During my Ph.D. studies I was based in CRANN, Advanced Microscopy Laboratory, Trinity College Dublin, where I focused on the structure-property correlation of two-dimensional Transition Metal Dichalcogenides materials at atomic resolution, emphasizing Aberration Corrected STEM, EELS, in-situ electrical measurements and device fabrication.
I carried out my postdoctoral research at the Scientific Centre for Material Science (WZMW), comprising the Structure & Technology Research Laboratory (STRL) in Philipps-Universität Marburg. The interdisciplinary research approach was manifested by close cooperation with various research groups in structural analysis, surface physics, spectroscopy, solid-state theory and device physics. My prime focus was investigating ion-conducting materials and semiconductor electric field measurements using in-situ biasing S/TEM combined with the Precession Electron Diffraction and 4DSTEM technique.