The Norwegian Center for Transmission Electron Microscopy is a world-class TEM centre providing access to expertise and state-of-the-art infrastructure for fundamental and applied research within the physical sciences in Norway.
The center is a consortium between the University of Oslo (UiO), the Norwegian University of Science and Technology (NTNU) and the Foundation for Industrial and Technical Research (SINTEF). It will consist of two nodes, one in Oslo and one in Trondheim.
The project has been granted 58 million NOK from the Norwegian Research Council in October 2011 and the three partners will contribute an additional 25 million NOK from their own funds. This will cover expenses for new equipment and building of facilities (71 million NOK) and the running costs for the first five years (12 million NOK). The project will build up on existing facilities and will make use of the already available expertise and personel. Including the contributions in kind, the net worth of the project is about 116 million NOK.
For a detailed description of the instruments in each node, please visit:
Research tasks are arranged in three levels, based on their complexity, requirements on resolution and performance:
- State-of-the-art instrument: Projects owned or planned by NorTEM research groups, including competence and technique development. External users will not generally operate these instruments.
- Advanced Instrument: Operators with agreed needs get access after sufficient training and skills. Formalized training maintains quality and ensures an effective usage.
- Standardized and routine TEM: Many users require hands-on access to perform simple tasks, where analysis is routine or TEM is a minor activity in a larger project. Once a specific task is approved, users can be trained.
The new instruments will provide a higher spatial and energy resolution thanks to the aberration correction on the probe forming lens and the latest generation of spectrometers. A few examples can be seen in the following images.
Cu-containing precipitates in Al-Mg-Si-Cu alloys (left image:Calin Marioara, SINTEF;
right image taken at a Titan Cs corrected microscope in CEN-DTU by Chris Boothroyd)
HRSTEM of a GaAs nanorod with Sb insertion. HAADF images from a) 2010F (Trondheim) and b) JEOL ARM200F probe corrected taken at JEOL research Centre, Tokyo, Japan Oct 09 by E. Okunishi. The bottom part in both figures is the same crystal structure, but only the probe corrected image matches the structure simulation (insert in b)) Unpublished data. Courtesy, T. van Helvoort, NTNU.
Atomic chemical mapping as explained in the FEI brochure.