Thomas Aarholt
Postdoctoral Fellow
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Centre for Materials Science and Nanotechnology Physics
Norwegian version of this page
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Gaustadalléen 23C
MiNaLab
0373 OSLO
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Postboks 1048 Blindern
0316 OSLO
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Publications
- Aarholt, Thomas; Frodason, Ymir Kalmann & Prytz, Øystein (2020). Imaging defect complexes in scanning transmission electron microscopy: Impact of depth, structural relaxation, and temperature investigated by simulations. Ultramicroscopy. ISSN 0304-3991. 209 . doi: 10.1016/j.ultramic.2019.112884 Full text in Research Archive.
- Kexue, Li; Aarholt, Thomas; Liu, Junliang; Hulme, Helen; Garner, Alistair; Preuss, Michael; Lozano-Perez, Sergio & Grovenor, Chris R.M. (2019). 3D-characterization of deuterium distributions in zirconium oxide scale using high-resolution SIMS. Applied Surface Science. ISSN 0169-4332. 464, s 311- 320 . doi: 10.1016/j.apsusc.2018.09.101 Full text in Research Archive.
- Sky, Thomas Neset; Johansen, Klaus Magnus H; Frodason, Ymir Kalmann; Aarholt, Thomas; Riise, Heine Nygard; Prytz, Øystein; Svensson, Bengt Gunnar & Vines, Lasse (2019). Diffusion of indium in single crystal zinc oxide: a comparison between group III donors. Semiconductor Science and Technology. ISSN 0268-1242. 34(2), s 1- 6 . doi: 10.1088/1361-6641/aafa4c Full text in Research Archive.
- Granerød, Cecilie Skjold; Bilden, Sindre Rannem; Aarholt, Thomas; Yao, Yu-Feng; Yang, C. C.; Look, David C.; Vines, Lasse; Johansen, Klaus Magnus H & Prytz, Øystein (2018). Direct observation of conduction band plasmons and the related Burstein-Moss shift in highly doped semiconductors: A STEM-EELS study of Ga-doped ZnO. Physical review B (PRB). ISSN 2469-9950. 98(11) . doi: 10.1103/PhysRevB.98.115301 Full text in Research Archive.
- Pedrazzini, S; Child, DJ; Aarholt, Thomas; Ball, C; Dowd, M; Girling, A; Cockings, H; Perkins, K; Hardy, MC; Stone, HJ & Bagot, PAJ (2018). On the Effect of Environmental Exposure on Dwell Fatigue Performance of a Fine-Grained Nickel-Based Superalloy. Metallurgical and Materials Transactions A. ISSN 1073-5623. 49(9), s 3908- 3922 . doi: 10.1007/s11661-018-4752-7 Full text in Research Archive.
- Sønsteby, Henrik Hovde; Aarholt, Thomas; Prytz, Øystein; Fjellvåg, Helmer & Nilsen, Ola (2018). First Complex Oxide Superconductor by Atomic Layer Deposition. Chemical Communications. ISSN 1359-7345. 54(59), s 8253- 8256 . doi: 10.1039/c8cc04998j
- Zhan, Wei; Venkatachalapathy, Vishnukanthan; Aarholt, Thomas; Kuznetsov, Andrej & Prytz, Øystein (2018). Band gap maps beyond the delocalization limit: correlation between optical band gaps and plasmon energies at the nanoscale. Scientific Reports. ISSN 2045-2322. 8(848), s 1- 7 . doi: 10.1038/s41598-017-18949-9 Full text in Research Archive.
- Aarholt, Thomas (2019). Såpeboblens fysikk.
- Aarholt, Thomas (2019). Å se atomer.
- Aarholt, Thomas; Frodason, Ymir Kalmann & Prytz, Øystein (2019). The impact of local relaxation on defect-complex STEM contrast.
- Haug, Kristian; Nguyen, Phuong Dan; Karlsen, Ole Bjørn; Aarholt, Thomas; Bazioti, Kalliopi & Prytz, Øystein (2019). Zinc ferrite spinel embedded in ZnO matrix for solar applications.
- Aarholt, Thomas; Sky, Thomas Neset; Nguyen, Phuong Dan & Prytz, Øystein (2018). Low-kV EELS band gapmeasurements on indium monolayer structures in ZnO.
- Hansen, Per-Anders Stensby; Zikmund, Tomas; Yu, Ting; Nitsche Kvalvik, Julie; Aarholt, Thomas; Prytz, Øystein; Meijerink, Andries & Nilsen, Ola (2018). Aromatic-fluoride nanocomposite materials by atomic layer deposition.
- Aarholt, Thomas (2017). Searching for single-defects by GPU-accelerated STEM Simulation.
- Aarholt, Thomas (2017). Searching for single-defects by GPU-accelerated STEM simulation.
- Aarholt, Thomas (2017). Searching for single-defects by GPU-accelerated STEM simulation.
- Aarholt, Thomas (2017). Smart Align - an acquisition tool for scanning microscopy.
- Aarholt, Thomas (2017). Statistical analysis for noise reduction and phase separation in spectroscopy techniques.
- Aarholt, Thomas & Lobato, Ivan (2017). MULTEM Simulation Workshop.
Published Apr. 3, 2017 10:02 AM
- Last modified Apr. 3, 2017 10:02 AM