Focused Ion Beam (FIB)

The lab in Forskningsparken houses a JEOL JIB-4500, a dual-beam focused ion beam (FIB) that allows sample preparation and investigation. The system is equipped with a Kleindiek micro manipulator needle, as well as a Kleindiek two-point electrical characterization system. The system is often used in conjunction with TEM-lamella fabrication.

Illustration: NORTEM

Booking and prices

Prices: Contact facility manager

Booking: Contact facility manager

 


Contact information: 

Facility Manager: Øystein Prytz
Location: Gaustadalleen 21, Forskningsparken
0316 OSLO
Norway

Instruments:

  • Dual-beam focused ion beam, JEOL JIB-4500

Description of services:

  • TEM lamella production
  • Three dimensional “Slice and View”
  • Microscale two-point electrical characterisation

About FIB

The lab in Forskningsparken houses a JEOL JIB-4500, which is a dual-beam focused ion beam (FIB) that allows sample preparation and investigation. The SEM gun is a LaB6 emitter. The sample stage takes samples up to 5 cm x 5cm sizes. The system is equipped with a Kleindiek micro manipulator needle to allow sample lift-out, as well as a Kleindiek two-point electrical characterization system. The system is often used in conjunction with TEM-lamella fabrication. The FIB is equipped with a gas-injection system that can deposit carbon and tungsten in large and small areas. The FIB can also induce stress-relaxation in a material and perform three-dimensional “slice and view”.

 

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Published Nov. 13, 2019 7:36 AM - Last modified Nov. 13, 2019 7:36 AM