Flextura Analysis System for Photoelectron Spectroscopy (XPS/UPS), Angle Resolved Photoelectron spectroscopy (ARPES) and Low Energy Electron Diffraction (LEED)

The Flextura cluster growth tool at the Micro and Nanotechnology Laboratory at the University of Oslo (UiO MiNaLab) is connected to an analysis chamber for advanced sample characterization. A plethora of concomitant surface science techniques are available that utilise a variety of photon sources, a state-of-the-art hemispherical electron analyser and low energy electron diffraction optics.

The system can resolve the chemical composition (stoichiometry), elemental chemical environment, integrated density of states, momentum-resolved electronic structure, and crystalline structure from the top few nm of the sample surface. Analysis takes place in an ultra-high vacuum environment so samples must be compatible, and due to charging effects, the measurement of insulators is challenging. For this reason, crystalline or polycrystalline semiconductors and metals are standard for characterisation. Semiconducting films deposited within the Flextura growth system can be measured directly following growth, negating the need to transfer them through ambient conditions that can alter the surface chemistry.

Instrument Features

  • Motorised sample manipulator accommodating up to 20 samples with max dimensions, 10 x 10 x 1 mm samples (smaller surface area samples can be measured down to 3 x 3 mm). XPS, UPS and LEED analysis on all sample pockets, ARPES only on the central pocket.
  • XR-50 Twin anode X-ray source for 1253.6 eV and 1486.7 eV photons.
  • UVS 10/35 ultraviolet helium discharge lamp for 21.2  eV and 40.8 eV photons.
  • PHOIBOS 150 hemispherical electron analyser and 2D CCD detector with real space and angle resolving lens modes.
  • Er-LEED 3000 Low energy electron diffraction optics 10-3000 eV kinetic energies.
  • Resolution for XPS is typically 0.2 eV.
  • Resolution in UPS is typically 0.1 eV.
  • Lateral resolution 0.01 mm.
  • Vacuum range 5E-10 mbar to 5E-7 mbar.

Prices

The Flextura Analysis Chamber for Photoelectron Spectroscopy (XPS/UPS), Low Energy Electron Diffraction (LEED) and Angle-Resolved Photoelectron spectroscopy (ARPES) is available for rent with or without an operator. Prices are in Norwegian kroner (NOK) excl. VAT. All prices are subject to change. 

User Category Price without operator/hour Price with operator/hour
Academia 800 NOK 1550 NOK
Start-up 1000 NOK 2100 NOK
Industry 1200 NOK 2300 NOK

The reduced fees for start-up companies are available for the first 24 months after start-up. Training costs are currently covered by NorFab.

Contact

Published May 3, 2021 11:13 PM - Last modified Dec. 18, 2024 2:01 PM