SEM-laboratory – Scanning Electron Microscope

The scanning electron microscope (SEM) at the department is a variable pressure FEG-SEM with dual EDS and high-resolution EBSD and cathodoluminescence (CL) system. It aids researchers and students over a range of research fields: sedimentology, environmental, petroleum, isotope- and structural geology, petrology, mineralogy, and micro-paleontology. Services are provided to industry and other when capacity.

The scanning electron microscope gives high resolution imaging of the smallest details of a rock surface. Photo: Gunn Kristin Tjoflot, UiO

The scanning electron microscope gives high resolution imaging of the smallest details of a rock surface. Photo: Gunn Kristin Tjoflot, UiO

Booking and prices

Prices: Contact Facility Manager

Booking: Contact Facility Manager

 


Contact information:

Facility Manager: Siri Lene Simonsen
Location: Sem Sælands vei 1
0371 OSLO
Norway

Instruments:

  • Hitachi SU5000 FE-SEM (Schottky FEG) including low-vacuum mode and inlens SE-detector (2015)
  • Dual Bruker Quantax XFlash 30 EDS system
  • Bruker e-Flash HR EBSD system with Argus
  • Delmic Sparc Advanced CL system

The laboratory has the following sample preparation equipment:
Carbon Coater Cressington 208C (shared with the Electron Microprobe Laboratory), and a Gold Coater: Quorum Q150R S.


Description of services:

  • High resolution SE and BSE imaging of thin sections and 3D samples
  • Low vacuum capabilities for non-coated samples
  • Semi quantitative chemical analysis and mapping with EDS
  • EBSD crystal orientation measurements, fully integrated with EDS for simultaneous element analysis
  • Cathodoluminescence imaging and spectral analyses

About the Scanning Electron Microscope

Three sample objects which can be scanned in a electron microscope. From top: a) Stub, b) Epoxy mount and c) Thin sections. Photo: Gunn Kristin Tjoflot, UiO
Three sample objects which can be scanned in a electron microscope. From top: a) Stub, b) Epoxy mount and c) Thin sections. Photo: Gunn Kristin Tjoflot, UiO

The SEM has a focused electron beam that scans over a surface. The electron beam interacts with the sample creating different signals like secondary electrons (SE), backscattered electrons (BSE), X-rays and light whitch can be recorded with different collectors.

For imaging, the SE, BSE and CL are used. X-rays for EDS (Energy Dispersive Spectroscopy) chemical analyses and element mapping.

The EBSD system reveals the crystal orientation of the minerals providing insight into deformation and microstructure of the sample.

The SEM microscope at the Department of Geosciences is also fitted with a powerful CL system for fast imaging and spectroscopy, giving information of zonation, crystal growth and deformation, which are not seen in SE or BSE.

The laboratory can by appointment be used for research activities and/or to assist students at the Department of Geosciences.

 

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Published May 12, 2019 10:09 AM - Last modified Aug. 14, 2020 10:29 AM