Vegard Skiftestad Olsen

Researcher - Semiconductor physics
Image of Vegard Skiftestad Olsen
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Phone +47-22840956
Mobile phone 99159872
Room 3204
Username
Visiting address Gaustadalleen 23C
Postal address Postboks 1048 Blindern 0316 OSLO
Other affiliations Faculty of Mathematics and Natural Sciences (Student)

Academic interests

Semiconductor materials for various applications, as ZnO-GaN alloys, II-IV nitrides and Ga2O3. Thin film processing and characterization. 

 

Courses taught

  • Fys2210 H2018

Background

  • Bachelor's degree: MENA UiO (2010-2013)
  • Master's degree: MENA UiO at the semiconductor physics group (2013-2015)

 

Tags: SMN, LENS

Publications

  • Olsen, Vegard Skiftestad; Baldissera, Gustavo; Zimmermann, Christian; Granerød, Cecilie Skjold; Bazioti, Kalliopi; Galeckas, Augustinas; Svensson, Bengt Gunnar; Kuznetsov, Andrej; Persson, Clas; Prytz, Øystein & Vines, Lasse (2019). Evidence of defect band mechanism responsible for band gap evolution in (ZnO)1−x(GaN)x alloys. Physical review B (PRB).  ISSN 2469-9950.  100(16) . doi: 10.1103/PhysRevB.100.165201
  • Olsen, Vegard Skiftestad; Bazioti, Kalliopi; Baldissera, Gustavo; Azarov, Alexander; Prytz, Øystein; Persson, Clas; Svensson, Bengt Gunnar; Kuznetsov, Andrej & Vines, Lasse (2019). Effects of Substrate and Post-Deposition Annealing on Structural and Optical Properties of (ZnO)1-x(GaN)x Films. Physica status solidi. B, Basic research.  ISSN 0370-1972.  256(6) . doi: 10.1002/pssb.201800529
  • Olsen, Vegard Skiftestad; Bazioti, Kalliopi; Azarov, Alexander; Svensson, Bengt Gunnar; Kuznetsov, Andrej; Prytz, Øystein & Vines, Lasse (2018). Bandgap bowing in crystalline (ZnO)1-x(GaN)x thin films; influence of composition and structural properties. Semiconductor Science and Technology.  ISSN 0268-1242.  34, s 1- 7 . doi: 10.1088/1361-6641/aaee4a
  • Riise, Heine Nygard; Olsen, Vegard Skiftestad; Azarov, Alexander; Galeckas, Augustinas; Sky, Thomas Neset; Svensson, Bengt Gunnar & Monakhov, Edouard (2016). Local homoepitaxy of zinc oxide thin films by magnetron sputtering. Thin Solid Films.  ISSN 0040-6090.  601, s 18- 21 . doi: 10.1016/j.tsf.2015.09.043

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  • Bathen, Marianne Etzelmüller; Borgersen, Jon Arthur; Karlsen, Kjetil; Nyborg, Martin; Olsen, Vegard Skiftestad; Reinertsen, Vilde Mari & Stulen, Fredrik Arnesen (2019). Skolebesøk ved MiNaLab.
  • Bathen, Marianne Etzelmüller & Olsen, Vegard Skiftestad (2019). Omvisning for FA og ELITE.
  • Bazioti, Kalliopi; Olsen, Vegard Skiftestad; Alexander, Azarov; Kuznetsov, Andrej; Vines, Lasse & Prytz, Øystein (2019). STEM-EELS investigation of defect formation and thermal evolution in ZnO.
  • Bazioti, Kalliopi; Olsen, Vegard Skiftestad; Azarov, Alexander; Kuznetsov, Andrej; Vines, Lasse & Prytz, Øystein (2019). Defect formation and thermal evolution in ZnO-based structures (Highlight talk).
  • Bazioti, Kalliopi; Olsen, Vegard Skiftestad; Johansen, Klaus Magnus H; Azarov, Alexander; Kuznetsov, Andrej; Vines, Lasse & Prytz, Øystein (2019). Transmission Electron Microscopy methods for atomic-scale investigations of semiconductor properties.
  • Bathen, Marianne Etzelmüller; Ingebrigtsen, Mads Eide; Olsen, Vegard Skiftestad; Rønning, Vegard & Vines, Lasse (2018). Omvisning for studieprogrammene FA og ELITE.
  • Bazioti, Kalliopi; Granerød, Cecilie Skjold; Olsen, Vegard Skiftestad; Vines, Lasse; Svensson, Bengt Gunnar & Prytz, Øystein (2018). (ZnO)1-X(GaN)X thin films studied by high-resolution structural and spectroscopic imaging.
  • Bazioti, Kalliopi; Granerød, Cecilie Skjold; Olsen, Vegard Skiftestad; Vines, Lasse; Svensson, Bengt Gunnar & Prytz, Øystein (2018). Structural-chemical characterization and bandgap measurements at the nanoscale of (ZnO)1-X(GaN)X thin films using (S)TEM methods.
  • Olsen, Vegard Skiftestad; Bazioti, Kalliopi; Azarov, Alexander; Granerød, Cecilie Skjold; Svensson, Bengt Gunnar; Kuznetsov, Andrej; Prytz, Øystein & Vines, Lasse (2018). Bandgap bowing in crystalline (ZnO)1-x(GaN)x thin films.
  • Bathen, Marianne Etzelmüller; Borgersen, Jon Arthur; Grini, Sigbjørn; Johansen, Klaus Magnus H; Nyborg, Martin; Olsen, Vegard Skiftestad & Vines, Lasse (2017). Omvisning FAM.
  • Bazioti, Kalliopi; Granerød, Cecilie Skjold; Olsen, Vegard Skiftestad; Vines, Lasse; Svensson, Bengt Gunnar & Prytz, Øystein (2017). (S)TEM characterization of magnetron sputtered ZnO:GaN alloy thin films.
  • Bazioti, Kalliopi; Granerød, Cecilie Skjold; Olsen, Vegard Skiftestad; Vines, Lasse; Svensson, Bengt Gunnar & Prytz, Øystein (2017). Structural and chemical characterization of (ZnO)1-X(GaN)X thin films using (S)TEM methods.
  • Bazioti, Kalliopi; Granerød, Cecilie Skjold; Olsen, Vegard Skiftestad; Vines, Lasse; Svensson, Bengt Gunnar & Prytz, Øystein (2017). Structural characterization and nanoscale bandgap measurements of (ZnO)1-X(GaN)X thin films.
  • Bazioti, Kalliopi; Granerød, Cecilie Skjold; Olsen, Vegard Skiftestad; Vines, Lasse; Svensson, Bengt Gunnar & Prytz, Øystein (2017). Structural/chemical characterization and bandgap measurements of (ZnO)1-X(GaN)X thin films using (S)TEM methods.
  • Olsen, Vegard Skiftestad; Vines, Lasse; Svensson, Bengt Gunnar & Kuznetsov, Andrej (2017). Bandgap reduction and the effects of post-deposition annealing on (ZnO)1-X(GaN)X thin films.
  • Riise, Heine Nygard; Aarseth, Bjørn Brevig; Kjeldstad, Torunn; Borgersen, Jon Arthur & Olsen, Vegard Skiftestad (2017). Besøk frå deltakarar i Fysikk-OL.
  • Riise, Heine Nygard; Bathen, Marianne Etzelmüller; Grini, Sigbjørn; Olsen, Vegard Skiftestad & Sky, Thomas Neset (2017). Omvisning MENA.

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Published Jan. 18, 2016 12:35 PM - Last modified Oct. 29, 2019 4:37 PM

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