The Microscopy Lab of NAFUMA group is equipped with an advanced set of instruments. Read further to know how the Scanning Electron Microscope (SEM) and the Atomic Force Microscope (AFM) work and to explore the possibilities of the new Scanning Tunneling Microscope (STM).
A SEM uses focused electrons at a certain density and acceleration voltage to scan a surface in the Nanometer scale. The primary electrons excite other electrons from the surface atoms (the detected, so-called secondary electrons). If an electron of an outer shell fills the formed hole, element-specific X-rays are emitted. A part of the primary electrons is scattered back after surface interaction, especially if heavy elements are present. All these interactions bear information on surface shape and composition and are of great interest for all disciplines dealing with materials.
The Atomic Force Microscope
Since the invention (1981) and awarding of Noble prize (1986) to Gerd Binnig and Heinrich Rohrer, a tremendous advance in STM instrumentation has been done, allowing for multiple applications of this technique in surface science, electronics, catalysis, electrochemistry, etc.