Self-test of ADC(s) in CMOS image sensor chip. Objective is to detect malfunction due to device failure in operation, for instance due to harsh environmental conditions (temperature, etc). Feasibility of implementing on-line tests should be studied. As well as off-line tests launched at power-up and/or in non capture mode.
Design av A/D converter BIST (built-in-self-test) suitable in digital CMOS camera chips.
Publisert 12. sep. 2013 13:03
- Sist endret 13. sep. 2013 09:46