Automatic definition of test procedures via constraint-solving
In the semiconductor industry, and many other industries, the importance of product testing cannot be emphasized enough. Often the success of a given product can be directly traced to the quality and quantity of the tests used to ensure the products meets their intended design-criteria. The process of defining system-wide tests typically involves the definition of sequences or procedures the product needs to perform in order to ensure its proper functionality, where, the larger and complex the system, the larger and complex the test-definition becomes. Thus, in a complex system, such as a very highly configurable and generic ASIC, to ensure that the number of tests and their quality is enough it a difficult challenge.
The project will be conducted in collaboration with Nordic Semiconductor
The goal of this project is to facilitate the generation of test-procedures by defining relationships within the different parts of the system as constraints. These constraints should then be used to generate a map over all potential sequences, or states, the system can be at. Those sequences can be then automatically translated to a specific language needed for the test itself, e.g., C/C++, Python, vhdl, etc.
The student will investigate existing open source solutions for constraint solvers and make the interface to a more practical testing environment used for ASIC testing.
Publisert 19. okt. 2020 08:59
- Sist endret 19. okt. 2020 09:04